中文参考译名:边界扫描测试：一种实用方法
Authors:Harry Bleeker, Peter van den Eijnden, Frans de Jon
Publisher: Springer
Keywords: approach, practical, test, scan, boundary
Number of Pages: 244
Published: 1992-12-31
List price: $229.00
ISBN-10: 0792392965
ISBN-13: 9780792392965

This new book will act an introduction to as well as a practical guide to Boundary-Scan testing. The ever increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimeter, have become available. As a consequence, the trace distances between the copper tracks on a printed circuit board came down to the same value. Not only

中文参考译名:扫描统计与应用（为工商及科技统计）
Authors:Joseph Glaz, N. Balakrishna,
Publisher: Birkhäuser Bosto
Keywords: statistics, technology, industry, applications, scan
Number of Pages: 352
Published: 1999-09-01
List price: $129.00
ISBN-10: 081764041X
ISBN-13: 9780817640415

Scan statistics are used in many areas of science and technology to analyze the occurrence of observed clusters of events in time and space. The goal is to determine whether an observed cluster of events occurred by chance if it is assumed that the observed events follow a specified probability model. "Scan Statistics" is a comprehensive, edited survey that brings together the work of leading authorities to present the most current advances in theory and methodology for this new area of statistical research and application. The chapters contain broad coverage of theory and new analytical and c

中文参考译名:扫描统计：方法与应用（为工商及科技统计）
Authors:Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenste
Publisher: Birkhäuser Bosto
Keywords: statistics, technology, industry, methods, scan, applications
Number of Pages: 394
Published: 2009-05-28
List price: $109.00
ISBN-10: 0817647481
ISBN-13: 9780817647483

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and appli

中文参考译名:扫描统计（施普林格系列）的统计
Authors:Joseph Glaz, Joseph Naus, Sylvan Wallenstei,
Publisher: Springer
Keywords: statistics, series, springer, scan
Number of Pages: 370
Published: 2001-08-09
List price: $119.00
ISBN-10: 038798819X
ISBN-13: 9780387988191

Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.